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Volumn 43, Issue 2, 2001, Pages 329-336

Influence of domain boundary width on the statics of 90° domains in epitaxial ferroelectric thin films

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EID: 0035255846     PISSN: 10637834     EISSN: None     Source Type: Journal    
DOI: 10.1134/1.1349484     Document Type: Article
Times cited : (2)

References (32)
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    • R. de Wit, in Fundamental Aspects of Dislocations, Ed. by J. A. Simmons, R. de Wit, and R. Bullough (National Bureau of Standards, Washington. 1970: Mir. Moscow, 1977). Vol. 1, pp. 651-673; J. Res. Nail. Bur. Stand., Sect. A 77 (1), 49 (1973): 77 (3), 359 (1973); 77 (5), 607 (1973).
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    • R. de Wit, in Fundamental Aspects of Dislocations, Ed. by J. A. Simmons, R. de Wit, and R. Bullough (National Bureau of Standards, Washington. 1970: Mir. Moscow, 1977). Vol. 1, pp. 651-673; J. Res. Nail. Bur. Stand., Sect. A 77 (1), 49 (1973): 77 (3), 359 (1973); 77 (5), 607 (1973).
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