Ultrahigh vacuum scanning probe microscopy studies of carbon onions

Physica E: Low-Dimensional Systems and Nanostructures

Volumn 9, Issue 2, 2001, Pages 300-304

  Hou, S M ^a   Tao, C G ^a   Zhang, G M ^a   Zhao, X Y ^a   Xue, Z Q ^a   Shi, Z J ^b   Gu, Z N ^b  

^a PEKING UNIVERSITY   (China)

^b PEKING UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CARBON; GRAPHITE; SCANNING TUNNELING MICROSCOPY; SUBSTRATES;

CARBON ONIONS; SCANNING PROBE MICROSCOPY; ULTRAHIGH VACUUM;

NANOTUBES;

EID: 0035254457     PISSN: 13869477     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1386-9477(00)00273-3     Document Type: Article

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