Kelvin probe measurements of microcrystalline silicon on a nanometer scale using SFM

Solar Energy Materials and Solar Cells

Volumn 66, Issue 1-4, 2001, Pages 171-177

  Breymesser, A ^a   Schlosser, V ^a   Peiro D ^b   Voz, C ^b   Bertomeu, J ^b   Andreu, J ^b   Summhammer, J ^c  

^a UNIVERSITY OF VIENNA   (Austria)

^b UNIVERSITY OF BARCELONA   (Spain)

^c TU WIEN   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL VAPOR DEPOSITION; CRYSTALLINE MATERIALS; ELECTRIC FIELD EFFECTS; MICROSCOPIC EXAMINATION; POTENTIOMETERS (ELECTRIC MEASURING INSTRUMENTS); SEMICONDUCTOR DIODES; THIN FILM DEVICES;

KELVIN PROBE MICROSCOPY; MICROCRYSTALLINE SILICON; NANOPOTENTIOMETRY; SCANNING FORCE MICROSCOPY; SURFACE POTENTIAL;

SILICON SOLAR CELLS;

EID: 0035254085     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0927-0248(00)00170-7     Document Type: Article

References (5)

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3. Stöger M., Breymesser A., Schlosser V., Ramadori M., Plunger V., Peiró D., Voz C., Bertomeu J., Nelhiebel M., Schattschneider P., Andreu J. Physica B. 273-274:1999;540.
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