Effect of front and back contact roughness on optical properties of single junction a-Si:H solar cells

Solar Energy Materials and Solar Cells

Volumn 66, Issue 1-4, 2001, Pages 353-359

  Zeman, M ^a   Van Swaaij, R A C M M ^a   Zuiddam, M ^a   Metselaar, J W ^a   Schropp, R E I ^b  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b UTRECHT UNIVERSITY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS SILICON; COMPUTER SIMULATION; INTERFACES (MATERIALS); LIGHT ABSORPTION; LIGHT SCATTERING; QUANTUM EFFICIENCY; SURFACE ROUGHNESS;

INTERFACE ROUGHNESS; SINGLE JUNCTION SOLAR CELLS;

SILICON SOLAR CELLS;

EID: 0035253944     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0927-0248(00)00194-X     Document Type: Article

References (9)

1. N. Ḧhne, R. Carius, H. Wagner, in: R. Schropp, et al. (Eds.), in: R. Schropp, et al. (Eds.), Materials Research Society. Proceedings, San Francisco, CA, in: R. Schropp, et al. (Eds.), Materials Research Society. Proceedings, San Francisco, CACA, 1998, pp. 107-112.
2. Schade H., Smith Z.E. J. Appl. Phys. 57(2):1985;568.
3. Leblanc F., Perrin J., Schmitt J. J. Appl. Phys. 75(2):1994;1074.
4. Zeman M., Willemen J.A., Vosteen L.L.A., Tao G., Metselaar J.W. Solar Energy Materials and Solar Cells. 46:1997;81.
5. Bennett H.E., Porteus J.O. J. Opt. Soc. Am. 51(2):1961;123.
6. G. Tao, M. Zeman, J.W. Metselaar, in: M. Hack et al. (Eds.), Amorphous Silicon Technology-1994, Vol. 336, Materials Research Society Proceedings San Francisco, CA, 1994, pp. 705-710.
7. H. Stiebig, A. Kreisel, K. Winz, N. Schultz, C. Beneking, Th. Eickhoff, H. Wagner, Proceedings of WCPC-1, Hawaii, 1994, pp. 603-606.
8. M. Zeman, R.A.C.M.M. van Swaaij, M. Zuiddam, J.W. Metselaar, R.E.I. Schropp, in: H.M. Branz et al. (Eds.), Amorphous and Heterogeneous Silicon Thin Films: Fundamentals to Devices-1999. Mater. Res. Soc. Proc., San Francisco, CA, 1999, pp. 725-730.
9. Ruud Schropp, Miro Zeman, Amorphous and Micro-crystalline Solar Cells: Modeling, Materials, and Device Technology, Kluwer Academic Publishers, Dordrecht, 1998, ISBN 0-7923-8317-6, p. 151.