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Volumn 557, Issue , 1999, Pages 725-730
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Effect of interface roughness on light scattering and optical properties of a-Si:H solar cells
a a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
AMORPHOUS SILICON;
ATOMIC FORCE MICROSCOPY;
COMPUTER SIMULATION;
DEPOSITION;
INTERFACES (MATERIALS);
LIGHT SCATTERING;
QUANTUM EFFICIENCY;
REFRACTIVE INDEX;
ROUGHNESS MEASUREMENT;
SEMICONDUCTOR JUNCTIONS;
SUBSTRATES;
SURFACE ROUGHNESS;
ASAHI U TYPE SUBSTRATE;
INTERFACE ROUGHNESS;
INTRINSIC LAYER THICKNESS;
SOLAR CELLS;
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EID: 0033298972
PISSN: 02729172
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1557/proc-557-725 Document Type: Article |
Times cited : (18)
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References (9)
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