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Volumn 557, Issue , 1999, Pages 725-730

Effect of interface roughness on light scattering and optical properties of a-Si:H solar cells

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS SILICON; ATOMIC FORCE MICROSCOPY; COMPUTER SIMULATION; DEPOSITION; INTERFACES (MATERIALS); LIGHT SCATTERING; QUANTUM EFFICIENCY; REFRACTIVE INDEX; ROUGHNESS MEASUREMENT; SEMICONDUCTOR JUNCTIONS; SUBSTRATES; SURFACE ROUGHNESS;

EID: 0033298972     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-557-725     Document Type: Article
Times cited : (18)

References (9)
  • 5
    • 33751125410 scopus 로고    scopus 로고
    • ed. by M. Hack et al., (Mater. Res. Soc. Proc. 336, San Francisco, CA 1994)
    • G. Tao, M. Zeman, and J.W. Metselaar. in Amorphous Silicon Technology-1994, ed. by M. Hack et al., (Mater. Res. Soc. Proc. 336, San Francisco, CA 1994), p. 705-710.
    • Amorphous Silicon Technology-1994 , pp. 705-710
    • Tao, G.1    Zeman, M.2    Metselaar, J.W.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.