Markov random fields in pattern recognition for semiconductor manufacturing

Technometrics

Volumn 43, Issue 1, 2001, Pages 66-72

  Baron, Michael ^a   Lakshminarayan, Choudur K ^b   Chen, Zhenwu ^b  

^a UNIVERSITY OF TEXAS AT DALLAS   (United States)

^b TEXAS INSTRUMENTS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MATHEMATICAL MODELS; MAXIMUM LIKELIHOOD ESTIMATION; NEURAL NETWORKS; PATTERN RECOGNITION; SEMICONDUCTOR DEVICE MANUFACTURE; SILICON WAFERS;

GIBBS SAMPLER;

MARKOV PROCESSES;

EID: 0035253262     PISSN: 00401706     EISSN: None     Source Type: Trade Journal    
DOI: 10.1198/00401700152404336     Document Type: Article

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