In situ observation of layer-by-layer growth by surface X-ray scattering using a rotating-anode source

Surface Science

Volumn 405, Issue 2-3, 1998, Pages

  Fujii, Y ^a   Nakamura, T ^a   Kai, M ^a   Yoshida, K ^a  

^a KOBE UNIVERSITY   (Japan)

Author keywords

Crystal growth; Total reflection; X ray scattering

Indexed keywords

ANODES; CRYSTAL GROWTH; ELECTROMAGNETIC WAVE SCATTERING; EPITAXIAL GROWTH; REFLECTION; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; SEMICONDUCTING LEAD COMPOUNDS; X RAY DIFFRACTION ANALYSIS; X RAYS;

LAYER BY LAYER GROWTH; ROTATING ANODE SOURCE; X RAY SCATTERING; X RAY TOTAL REFLECTION;

SURFACE PHENOMENA;

EID: 0348202955     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(98)00166-6     Document Type: Article

References (10)

1. J.J. Harris, B.A. Joyce, Surf. Sci. 108 (1981) L90.
2. H. Neave, B.A. Joyce, P.J. Dobson, N. Norton, Appl. Phys. A 31 (1983) 1.
3. J.M. Van Hove, C.S. Lent, P.R. Pukite, P.I. Cohen, J. Vac. Sci. Technol. B 1 (1983) 741.
4. J.Y. Tsao, T.M. Brennan, B.E. Hammons, J. Crystal Growth 111 (1991) 125.
5. E. Vlieg, A.W. Denier van der Gon, J.F. van der Veen, J.E. MacDonald, C. Norris, Phys. Rev. Lett. 61 (1988) 2241.
6. H.A. van der Vegt, J. Alvarez, X. Torrelles, S. Ferrer, E. Vlieg, Phys. Rev. B 52 (1995) 17443.
7. P.H. Fuoss, D.W. Kisker, F.J. Lamelas, G.B. Stephenson, P. Imperatori, S. Brennan, Phys. Rev. Lett. 69 (1992) 2791.
8. Y. Fujii, K. Yoshida, T. Nakamura, K. Yoshida, Rev. Sci. Instrum. 68 (1997) 1975.
9. P. Eisenberger, W.C. Marra, Phys. Rev. Lett. 46 (1981) 1081.
10. J. Fuchs, Z. Feit, H. Preier, Appl. Phys. Lett. 53 (1988) 894.