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Volumn 65, Issue 1, 2001, Pages 517-523
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Electrical properties of multicrystalline silicon produced by electromagnetic casting process: degradation and improvement
d
NONE
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Author keywords
[No Author keywords available]
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Indexed keywords
CHARGE CARRIERS;
CONTINUOUS CASTING;
CRUCIBLES;
CRYSTALLINE MATERIALS;
DOPING (ADDITIVES);
ELECTRIC PROPERTIES;
ELECTRON BEAMS;
PHOSPHORUS;
PHOTOCONDUCTIVITY;
PHOTOVOLTAIC CELLS;
SILICON WAFERS;
THERMAL EFFECTS;
COLD CRUCIBLE PULLING PROCESS;
ELECTRON BEAM INDUCED CURRENT;
MINORITY CARRIERS;
MULTICRYSTALLINE SILICON;
PHOTOCONDUCTIVITY DECAY METHOD;
THERMAL PHOSPHORUS DIFFUSION;
SILICON;
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EID: 0035194513
PISSN: 09270248
EISSN: None
Source Type: Journal
DOI: 10.1016/S0927-0248(00)00135-5 Document Type: Article |
Times cited : (12)
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References (8)
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