Combining Raman Chemical Imaging and Scanning Electron Microscopy to Characterize Ambient Fine Particulate Matter

Aerosol Science and Technology

Volumn 34, Issue 1, 2001, Pages 108-117

  Nelson, Matthew P ^a   Zugates, Christopher T ^a   Treado, Patrick J ^a   Casuccio, Gary S ^b   Exline, David L ^b   Schlaegle, Steven F ^b  

^a ChemIcon Inc   (United States)

^b RJ LEE GROUP   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AIR QUALITY STANDARD; AIR SAMPLING; AMBIENT AIR; ARTICLE; ENVIRONMENTAL MONITORING; FILTER; IMAGING SYSTEM; PARTICULATE MATTER; PRIORITY JOURNAL; RAMAN SPECTROMETRY; SCANNING ELECTRON MICROSCOPY; SPECTROSCOPY;

EID: 0035174059     PISSN: 02786826     EISSN: 15217388     Source Type: Journal    
DOI: 10.1080/02786820120709     Document Type: Article

References (19)

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