Dynamic simulator for WIP analysis in semiconductor manufacturing

IEEE International Symposium on Semiconductor Manufacturing Conference, Proceedings

Volumn , Issue , 2001, Pages 71-74

  Collins, D W ^a   Lakshman, V ^a   D'Arcy Collins, L ^a  

^a ARIZONA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BIPOLAR SEMICONDUCTOR DEVICES; DATABASE SYSTEMS; GRAPHICAL USER INTERFACES; MAINTENANCE; REAL TIME SYSTEMS;

MANUFACTURING EXECUTION SYSTEM (MES);

SEMICONDUCTOR DEVICE MANUFACTURE;

EID: 0035165641     PISSN: 1523553X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (4)

1. Implementation of minimum inventory variability scheduling 1-step ahead policy in a large semiconductor manufacturing facility
2. Inventory modelling yields significant cycle-time improvements
3. A simulation study to compare minimum inventory variability policies (MIVP®) and first-in-first-out (FIFO) algorithm
4. Interdisciplinary research on modelling and scheduling of semiconductor manufacturing operations