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Volumn , Issue , 2001, Pages 73-74

Fabrication & characterization of Schottky Junction Transistors

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTRIC CURRENTS; ELECTRON BEAM LITHOGRAPHY; INTERFACES (MATERIALS); RAPID THERMAL ANNEALING; SEMICONDUCTING SILICON; SEMICONDUCTOR DOPING; SEMICONDUCTOR JUNCTIONS;

EID: 0035164147     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (2)

References (3)
  • 3
    • 0006579936 scopus 로고    scopus 로고
    • Generously donated by Ibis Technology Corporation


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.