Epitaxial growth of aluminum on permalloy

Thin Solid Films

Volumn 381, Issue 1, 2001, Pages 160-163

  Li, Yun ^a   Wang, Shan X ^a   Khanna, Gaurav ^a   Clemens, Bruce M ^a  

^a Stanford University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; ATOMIC FORCE MICROSCOPY; EPITAXIAL GROWTH; GRAIN BOUNDARIES; LATTICE CONSTANTS; NICKEL COMPOUNDS; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

PERMALLOY; SPIN-DEPENDENT TUNNELING JUNCTIONS;

MAGNETIC THIN FILMS;

EID: 0035147740     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(00)01545-5     Document Type: Article

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