Aging effect of SiO2 xerogel film on its microstructure and dielectric properties

Applied Surface Science

Volumn 169-170, Issue , 2001, Pages 452-456

  Kim, Jung Ho ^a   Kim, Hong Ryul ^a   Park, Hyung Ho ^a   Hyun, Sang Hoon ^a  

^a Yonsei University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

AGING OF MATERIALS; CRYSTAL MICROSTRUCTURE; MORPHOLOGY; POROSITY; SILICA GEL; SURFACE TREATMENT;

XEROGELS;

DIELECTRIC FILMS;

EID: 0035127134     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(00)00702-9     Document Type: Article

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