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Volumn 29, Issue 1, 2001, Pages 83-89
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Band offsets and properties of Si1-xGex/Si material systems
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Author keywords
[No Author keywords available]
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Indexed keywords
INTERFACES (MATERIALS);
PHOTOLUMINESCENCE;
SEMICONDUCTING SILICON;
SEMICONDUCTING SILICON COMPOUNDS;
SILICON GERMANIDE;
VALENCE BAND OFFSET (VBO);
SEMICONDUCTOR MATERIALS;
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EID: 0035125123
PISSN: 07496036
EISSN: None
Source Type: Journal
DOI: 10.1006/spmi.2000.0924 Document Type: Article |
Times cited : (10)
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References (14)
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