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Volumn 470, Issue 3, 2001, Pages 255-264
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Surface structure and electron density dependence of scattered Ne+ ion fractions from the Si(1 0 0)-(2×1) surface
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Author keywords
[No Author keywords available]
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Indexed keywords
CARRIER CONCENTRATION;
CRYSTAL ORIENTATION;
ELECTRON SCATTERING;
MATHEMATICAL MODELS;
MORPHOLOGY;
SILICON;
SURFACE ROUGHNESS;
ION-SOLID INTERACTIONS;
NEON;
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EID: 0035125020
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/S0039-6028(00)00865-7 Document Type: Article |
Times cited : (4)
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References (34)
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