메뉴 건너뛰기




Volumn 470, Issue 3, 2001, Pages 255-264

Surface structure and electron density dependence of scattered Ne+ ion fractions from the Si(1 0 0)-(2×1) surface

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; CRYSTAL ORIENTATION; ELECTRON SCATTERING; MATHEMATICAL MODELS; MORPHOLOGY; SILICON; SURFACE ROUGHNESS;

EID: 0035125020     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(00)00865-7     Document Type: Article
Times cited : (4)

References (34)
  • 1
    • 0001479982 scopus 로고
    • Scattering and Charge-Transfer Dynamics
    • in: J.W. Rabalais (Ed.), Wiley, New York
    • B.H. Cooper, E.R. Behringer, Scattering and Charge-Transfer Dynamics, in: J.W. Rabalais (Ed.), Low Energy Ion Surface Interactions, Wiley, New York, 1994, pp. 263-312.
    • (1994) Low Energy Ion Surface Interactions , pp. 263-312
    • Cooper, B.H.1    Behringer, E.R.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.