Analytical electrostatic model of silicon conical field emitters-part II: Extension to devices with focusing electrode

IEEE Transactions on Electron Devices

Volumn 48, Issue 1, 2001, Pages 144-148

  Dvorson, Leonard ^a,b   Ding, Meng ^a,b   Ibitayo Akinwande, Akintunde ^a,b  

^a IEEE   (United States)

^b Massachusetts Institute of Technology Cambridge   (United States)

Author keywords

Electron beam focusing; Electron beam semiconductor devices; Electron emission; Electrostatic analysis, electrostatic focusing; Flat panel displays; Vacuum microelectronics

Indexed keywords

ANALYTICAL ELECTROSTATIC MODEL; BOWLING PIN MODEL; ELECTRON BEAM FOCUSING; SILICON CONICAL FIELD EMITTER; VACUUM MICROELECTRONICS;

CAPACITANCE; ELECTRIC POTENTIAL; ELECTRODES; ELECTRON EMISSION; ELECTROSTATICS; FLAT PANEL DISPLAYS; MATHEMATICAL MODELS; SEMICONDUCTING SILICON; SEMICONDUCTOR DEVICES;

MICROELECTROMECHANICAL DEVICES;

EID: 0035124407     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.892181     Document Type: Article

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