Three-dimensional crystallographic orientation measurement of polycrystalline alumina by Raman-microprobe polarization

Nippon Seramikkusu Kyokai Gakujutsu Ronbunshi/Journal of the Ceramic Society of Japan

Volumn 109, Issue 1265, 2001, Pages 12-15

  Takeda, Yasutoshi ^a,b   Shibata, Noriyoshi ^a   Okada, Akira ^a,c  

^a JAPAN FINE CERAMICS CENTER   (Japan)

^b MITSUBISHI ELECTRIC CORPORATION   (Japan)

^c NISSAN MOTOR CO   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL ORIENTATION; LIGHT POLARIZATION; POLYCRYSTALLINE MATERIALS; RAMAN SPECTROSCOPY; SAPPHIRE;

RAMAN MICROPROBE POLARIZATION;

ALUMINA;

EID: 0035119097     PISSN: 09145400     EISSN: None     Source Type: Journal    
DOI: 10.2109/jcersj.109.12     Document Type: Article

References (4)

1. Takeda, Y., Shibata, N. and Okada, A., J. Ceram. Soc. Japan, 108, 888-91 (2000).
2. Turrell, G., J. Raman Spectrosc., 15, 103-08 (1984).
3. Loudon, R., Adv. Phys., 13, 423-82 (1964).
4. Porto, S. P. S. and Krishnan, R. S., J. Chem. Phys., 47, 1009-12 (1967).