Crystallographic orientation measurement in alumina using raman-microprobe polarization

Journal of the Ceramic Society of Japan

Volumn 108, Issue 10, 2000, Pages 888-891

  Takeda, Yasutoshi ^a,b   Shibata, Noriyoshi ^a   Okada, Akira ^a,c  

^a JAPAN FINE CERAMICS CENTER   (Japan)

^b MITSUBISHI ELECTRIC CORPORATION   (Japan)

^c NISSAN MOTOR CO   (Japan)

Author keywords

Crystal grains; Crystallographic orientation; Raman scattering; Sapphire; Translucent alumina

Indexed keywords

RAMAN MICROPROBE POLARIZATION; TRANSLUCENT ALUMINA;

CERAMIC MATERIALS; CRYSTAL ORIENTATION; LIGHT POLARIZATION; MATHEMATICAL MODELS; POLYCRYSTALLINE MATERIALS; RAMAN SCATTERING; RAMAN SPECTROSCOPY; SAPPHIRE; TENSORS;

ALUMINA;

EID: 0034296541     PISSN: 09145400     EISSN: None     Source Type: Journal    
DOI: 10.2109/jcersj.108.1262_888     Document Type: Article

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