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Physical Review B - Condensed Matter and Materials Physics

Volumn 63, Issue 8, 2001, Pages 854141-854148

Initial growth mode of ultrathin Ag films on an Al(111) surface

(9) Kim, S H a Seo, Jikeun b Kim, W d Park, C Y a Oh, S J d Seo, J M e Min, H G f Kim, J S c Shin, Y c

a Sungkyunkwan University (South Korea)

b Chodang University (South Korea)

c Sookmyung Women's University (South Korea)

d Seoul National University (South Korea)

e Chonbuk National University (South Korea)

f Hong Ik University (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; SILVER;

ARTICLE; AUGER ELECTRON SPECTROSCOPY; ELECTRON DIFFRACTION; FILM; GROWTH; X RAY SPECTROMETRY;

EID: 0035109167 PISSN: 01631829 EISSN: None Source Type: Journal
DOI: 10.1103/physrevb.63.085414 Document Type: Article

Times cited : (10)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.