Coaxial scanning near-field optical microscope tips: An alternative for conventional tips with high transmission efficiency?

Journal of Microscopy

Volumn 201, Issue 3, 2001, Pages 383-387

  Demming, F ^a   Jersch, J ^a   Klein, S ^a   Dickmann, K ^a  

^a UNIVERSITY OF APPLIED SCIENCES   (Germany)

Author keywords

Coaxial tips; Electromagnetic waves; Finite integration technique; SNOM

Indexed keywords

ELECTRIC FIELDS; MICROSCOPES; NEAR FIELD SCANNING OPTICAL MICROSCOPY;

COAXIAL TIP; FINITE INTEGRATION TECHNIQUE; FINITE-INTEGRATION TECHNIQUE; HIGH TRANSMISSION; LATERAL RESOLUTION; NANOMETRES; NEAR-FIELD OPTICAL PROBES; PROBE TIPS; SCANNING NEAR-FIELD OPTICAL MICROSCOPE; TRANSMISSION EFFICIENCY;

ELECTROMAGNETIC WAVES;

ARTICLE; CALCULATION; ELECTROMAGNETIC RADIATION; GEOMETRY; MICROSCOPY; OPTICAL ROTATION; PRIORITY JOURNAL; SCANNING ELECTRON MICROSCOPY; SCANNING NEAR FIELD OPTICAL MICROSCOPY; SIGNAL TRANSDUCTION; TECHNIQUE; WAVEFORM;

EID: 0035100274     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1046/j.1365-2818.2001.00782.x     Document Type: Article

References (10)

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8. Concentration of an optical field in an optical coaxial line