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Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 19, Issue 1, 2001, Pages 87-93

`Standardization' of field emission measurements

(5) Zhirnov, V V a Lizzul Rinne, C b Wojak, G J b Sanwald, R C b Hren, J J b

a SEMICONDUCTOR RESEARCH CORPORATION (United States)

b NORTH CAROLINA STATE UNIVERSITY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT DENSITY; DIAMOND FILMS; DIAMOND LIKE CARBON FILMS; ELECTRIC FIELD EFFECTS; ELECTRON EMISSION; FIELD EMISSION CATHODES; MATHEMATICAL MODELS; MICROELECTRONICS; MICROWAVE TUBES;

FIELD EMISSION (FE) DEVICES;

FIELD EMISSION DISPLAYS;

EID: 0035078348 PISSN: 0734211X EISSN: None Source Type: Journal
DOI: 10.1116/1.1342006 Document Type: Article

Times cited : (62)

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