Improvement of the double crystal diffractometer at the Geesthacht Neutron Facility (GeNF) by means of perfect channel-cut silicon crystals

Physica B: Condensed Matter

Volumn 241-243, Issue , 1997, Pages 71-73

  Bellmann, D ^a   Klatt, M ^a   Kampmann, R ^a   Wagner, R ^a  

^a INSTITUTE OF MATERIALS RESEARCH   (Germany)

Author keywords

Channel cut crystal; Double crystal diffractometer; Small angle neutron scattering

Indexed keywords

CRYSTALS; NEUTRON DIFFRACTION; NEUTRON REFLECTION; SEMICONDUCTING SILICON;

CHANNEL CUT CRYSTAL; DOUBLE CRYSTAL DIFFRACTOMETER; SMALL ANGLE NEUTRON SCATTERING;

NEUTRON SCATTERING;

EID: 11544353029     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4526(97)00869-7     Document Type: Article

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