Study of the imaging conditions and processing for the aspect control of specular surfaces

Journal of Electronic Imaging

Volumn 10, Issue 1, 2001, Pages 196-202

  Delcroix, G ^a   Seulin, R ^a   Lamalle, B ^a   Gorria, P ^a   Merienne, F ^a  

^a UNIVERSITÉ DE BOURGOGNE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

LAPLACIAN FILTERS;

COMPUTER VISION; DATA ACQUISITION; DEFECTS;

IMAGE PROCESSING;

EID: 0035065178     PISSN: 10179909     EISSN: 1560229X     Source Type: Journal    
DOI: 10.1117/1.1314333     Document Type: Article

References (10)

1. Reflection properties of machined metal surfaces
2. Structured highlight inspection of specular surfaces
3. Specular surface inspection using structured highlight and Gaussian images
4. Shape from focus
5. Dark field, Scheimpflug imaging for surface inspection
6. Detection of small coating defects on automobile body by traveling illumination
7. Online defects localization on mirror-like surfaces
8. Measurement of the 3-D shape of specular polyhedrons using an M-array coded light source