Dark field, scheimpflug imaging for surface inspection

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3029, Issue , 1997, Pages 57-68

  Bakolias, C ^a   Forrest, A K ^a  

^a IMPERIAL COLLEGE LONDON   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0002748715     PISSN: 0277786X     EISSN: 1996756X     Source Type: Conference Proceeding    
DOI: 10.1117/12.271248     Document Type: Conference Paper

References (8)

1. H. W. Lippincott and H. Stark", Optical Digital Detection of Dents and Scratches on Specular Metal Surface", Applied Optics, Vol. 21, No. 16, pp. 2875-2881, 1982.
2. T. Sawatari, "Surface Flaw Detection using Oblique Angle Illumination", Applied Optics, Vol. 11, No. 6, pp. 1337-1344, 1972.
3. J. A. Ogilvy, Theory of wave scattering from random rough surfaces, IOP Publishing Ltd, p. 2, 1991.
4. Petr Beckmann and Andre Spizzichino, The scattering of Electromagnetic Waves from Random Rough Surfaces, Pergamon Press Oxford London New York Paris, 1963.
5. K. A. O'Donnel and E. R. Mendez, "Experimental study of scattering from characterised random surface", Journal of Optical Society of America, Vol.. 4, No. 7, pp. 1194-1205, 1994.
6. C. Bakolias, Oblique Imaging of Scattered Light for Surface Inspection, PhD Thesis, Imperial College of Science Technology and Medicine, pp. 186-191, 1996.
7. Sidney F. Ray, Applied Photographic Optics, Focal Press London & Boston, p. 199, 1980.
8. R. E. Altenhofen, chapter on rectification in Manual of Photogrammetry, American Society of Photogrammetry, Washington D. C, p. 738, 1980