Fast profilometry based on the projection of a single grating at two frequencies

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4309, Issue , 2001, Pages 240-250

  Sansoni, G ^a   Carocci, M ^a  

^a UNIVERSITY OF BRESCIA   (Italy)

Author keywords

3D optical measurement; Phase profilometry; Phase unwrapping; Structured light projection

Indexed keywords

ALGORITHMS; COMPUTER VISION; OPTICAL RESOLVING POWER; PROFILOMETRY;

PHASE PROFILOMETRY; PHASE UNWRAPPING; STRUCTURED LIGHT PROJECTION;

DIFFRACTION GRATINGS;

EID: 0035058352     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.410879     Document Type: Conference Paper

References (11)

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