High-density optical data storage using scattering-mode super-resolution near-field structure

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4085, Issue , 2001, Pages 204-207

  Men, L ^a   Tominaga, J ^a   Fuji, H ^a   Chen, Q ^a   Atoda, N ^a  

^a NATL INST FOR ADV INTERDISC RES   (Japan)

Author keywords

Ge2Sb2Te5, AgOx; Mask layer; Scattering mode super resolution near field structure

Indexed keywords

DEPOSITION; DOPING (ADDITIVES); ELLIPSOMETRY; GERMANIUM COMPOUNDS; GLASS; LIGHT SCATTERING; MAGNETRON SPUTTERING; OPTICAL FILMS; OPTICAL PROPERTIES; SILVER; SUBSTRATES; THERMODYNAMIC PROPERTIES;

CRYSTALLIZATION TEMPERATURE; HIGH DENSITY OPTICAL DATA STORAGE; OPTICAL CONSTANT; SCATTERING MODE SUPER RESOLUTION NEAR FIELD STRUCTURE;

OPTICAL DISK STORAGE;

EID: 0035052977     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.416843     Document Type: Conference Paper

References (2)

1. An approach for recording and readout beyond the diffraction limit with an Sb thin film
2. A near-field recording and readout technology using a metallic probe in an optical disk