SCOPUS 정보 검색 플랫폼

IEEE Transactions on Circuits and Systems II: Analog and Digital Signal Processing

Volumn 48, Issue 1, 2001, Pages 56-64

Continuous-time feedback in floating-gate MOS circuits

b GEORGIA INSTITUTE OF TECHNOLOGY (United States)

Author keywords

Continuous floating gate programming; Electron tunneling; Floating gate circuits; Floating gate dynamics; Hot electron injection

Indexed keywords

CONTINUOUS FLOATING-GATE PROGRAMMING; FLOATING-GATE CIRCUITS; FLOATING-GATE MOS CIRCUITS; HOT ELECTRON INJECTION;

CMOS INTEGRATED CIRCUITS; EIGENVALUES AND EIGENFUNCTIONS; ELECTRIC POTENTIAL; ELECTRON TUNNELING; GATES (TRANSISTOR); INTEGRATED CIRCUIT MANUFACTURE; MATHEMATICAL MODELS;

MOS DEVICES;

EID: 0035051734 PISSN: 10577130 EISSN: None Source Type: Journal
DOI: 10.1109/82.913187 Document Type: Article

Times cited : (44)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.