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Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4145, Issue , 2001, Pages 88-96

Global optimization and relectivity data fitting for x-ray multilayer mirrors by means of genetic algorithms

(2) Del Rio M S a Pareschi, G a

a EUROPEAN SYNCHROTRON RADIATION FACILITY (France)

Author keywords

Data modelling; Evolutionary systems; Genetic algorithms; Global optimization; Multilayers; X ray reflectivity

Indexed keywords

COMPUTER SIMULATION; GENETIC ALGORITHMS; GLOBAL OPTIMIZATION; OPTICAL MULTILAYERS; RANDOM PROCESSES; TELESCOPES;

EVOLUTIONARY SYSTEMS; X RAY MULTILAYER MIRRORS; X RAY REFLECTIVITY;

X RAY OPTICS;

EID: 0035051727 PISSN: 0277786X EISSN: None Source Type: Conference Proceeding
DOI: 10.1117/12.411624 Document Type: Conference Paper

Times cited : (14)

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