Influence of the measurement parameters on the reliability of ferroelectric thin films

Integrated Ferroelectrics

Volumn 32, Issue 1-4, 2001, Pages 1-9

  Grossmann, M ^a   Lohse, O ^a   Bolten, D ^a   Boettger, U ^a   Waser, R ^a   Tiedke, S ^a   Schmitz, T ^a   Kall, U ^a   Kastner, M ^a   Schindler, G ^a   Hartner, W ^a  

^a RWTH AACHEN UNIVERSITY   (Germany)

Author keywords

Fatigue; Ferroelectric thin films; PZT; SBT

Indexed keywords

CAPACITORS; DATA STORAGE EQUIPMENT; ELECTRIC PROPERTIES; FATIGUE OF MATERIALS; HYSTERESIS; LEAD COMPOUNDS; NATURAL FREQUENCIES; RELIABILITY; STRONTIUM COMPOUNDS;

FATIGUE EXCITATION SIGNAL; FREQUENCY EXCITATION SIGNAL;

FERROELECTRIC THIN FILMS;

EID: 0035041694     PISSN: 10584587     EISSN: None     Source Type: Journal    
DOI: 10.1080/10584580108215672     Document Type: Conference Paper

References (11)