|
|
|
Volumn 35, Issue 1-4, 2001, Pages
|
|
Conduction mechanism in antiferroelectric PbZrO3 thin films - Analysis of charge carrier trapping phenomenon
a
|
|
Author keywords
Antiferroelectric lead zirconate thin films; Shallow traps and deep traps; Space charge limited conduction
|
|
Indexed keywords
CRYSTAL DEFECTS;
ELECTRIC POTENTIAL;
ELECTRON TRAPS;
EXCIMER LASERS;
FERROELECTRIC THIN FILMS;
FERROELECTRICITY;
GRAIN BOUNDARIES;
LASER ABLATION;
LEAD COMPOUNDS;
POLYCRYSTALLINE MATERIALS;
SILICON;
SUBSTRATES;
ANTIFERROELECTRIC LEAD ZIRCONATE THIN FILMS;
CHARGE CARRIER TRAPPING;
DOMAIN WALL REORIENTATION;
FERROELECTRIC PHASE SWITCHING;
LAMPERTS THEORY OF SPACE CHARGE LIMITED CONDUCTION;
PULSED EXCIMER LASER ABLATION;
ANTIFERROELECTRIC MATERIALS;
|
|
EID: 0035039915
PISSN: 10584587
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
|
Times cited : (1)
|
|
References (25)
|
