메뉴 건너뛰기




Volumn 4204, Issue , 2001, Pages 89-98

Interferometric displacement tracking based on Hilbert transform processing

Author keywords

[No Author keywords available]

Indexed keywords

ACCELERATION MEASUREMENT; INTERFEROMETERS; LASERS; MATHEMATICAL TRANSFORMATIONS; MIRRORS; OPTOELECTRONIC DEVICES; VELOCITY MEASUREMENT;

EID: 0035024355     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.417397     Document Type: Conference Paper
Times cited : (3)

References (18)
  • 2
    • 84975586767 scopus 로고
    • Absolute distance measurement by wavelength shift interferometry with a laser diode: Some systematic error sources
    • (1987) Appl. Opt. , vol.26 , pp. 1654-1660
    • Kikuta, H.1    Iwata, K.2    Nagata, R.3
  • 4
    • 84880400781 scopus 로고
    • Wavelength-shift interferometry for distance measurements using the Fourier transform technique for fringe analysis
    • (1991) Appl. Opt. , vol.30 , pp. 4046-4055
    • Suematsu, M.1    Takeda, M.2
  • 11
    • 84975575671 scopus 로고
    • Interferometric laser profilometer for rough surfaces
    • (1991) Opt. Lett. , vol.16 , pp. 357-359
    • De Groot, P.1
  • 16
    • 0001551218 scopus 로고    scopus 로고
    • Dispersion-insensitive measurement of thickness and group refractive index by low-coherence interferometry
    • (2000) Appl. Opt. , vol.39 , pp. 4607-4615
    • Murphy, D.F.1    Flavin, D.A.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.