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Volumn 25, Issue 18, 1986, Pages 3137-3140
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Sinusoidal phase modulating interferometry for surface profile measurement
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 69949166537
PISSN: 1559128X
EISSN: 21553165
Source Type: Journal
DOI: 10.1364/AO.25.003137 Document Type: Article |
Times cited : (233)
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References (8)
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