Positron microscopy

Materials Science Forum

Volumn 363-365, Issue , 2001, Pages 409-414

  Kogel G ^a  

^a BUNDESWEHR UNIVERSITY MUNICH   (Germany)

Author keywords

Positron microscopy; Pulsed positron microbeam; Spatial resolution; Specific trapping rate

Indexed keywords

COBALT; CRYSTALLINE MATERIALS; CURRENT DENSITY; ELECTRON SOURCES; ELECTRON TRAPS; ELECTRONS; ION IMPLANTATION; RADIOACTIVE MATERIALS; SCANNING ELECTRON MICROSCOPY; SURFACES; TUNGSTEN;

MULTI-POSITRON PULSES; POSITRON MICROBEAM; POSITRON MICROSCOPY; SCANNING POSITRON MICROSCOPE; SINGLE-CRYSTALLINE TUNGSTEN MODERATOR;

POSITRONS;

EID: 0035009472     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/msf.363-365.409     Document Type: Conference Paper

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