Design of redundant systems protected against common-mode failures

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 2001, Pages 190-195

  Mitra, S ^a   McCluskey, E J ^a  

^a Stanford University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER AIDED DESIGN; ERRORS; FAILURE ANALYSIS; FLIP FLOP CIRCUITS; MATHEMATICAL MODELS; REDUNDANCY; RELIABILITY; SHIFT REGISTERS; SYSTEMS ANALYSIS;

DATA INTEGRITY; FAULT MODELS; INPUT REGISTER; TRIPLE MODULAR REDUNDANCY;

FAULT TOLERANT COMPUTER SYSTEMS;

EID: 0034994921     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (14)

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8. Design of redundant systems protected against common-mode failures
9. Heavy ion and proton-induced single event multiple upset
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11. SIS: A system for sequential circuit synthesis