Common-mode failures in redundant VLSI systems: A survey

IEEE Transactions on Reliability

Volumn 49, Issue 3, 2000, Pages 285-295

  Mitra, Subhasish ^a,b   Saxena, Nirmal R ^a,b   McCluskey, Edward J ^a,b  

^a IEEE   (United States)

^b Stanford University   (United States)

Author keywords

Common mode failures; Concurrent error detection; Data integrity; Design diversity; Redundancy

Indexed keywords

COMMON MODE FAILURE (CMF); DATA INTEGRITY;

COMPUTER AIDED DESIGN; CONCURRENCY CONTROL; ERROR DETECTION; FAILURE ANALYSIS; INTEGRATED CIRCUIT MANUFACTURE; REDUNDANCY;

VLSI CIRCUITS;

EID: 0034260097     PISSN: 00189529     EISSN: None     Source Type: Journal    
DOI: 10.1109/24.914545     Document Type: Article

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