Computer simulation approach to reliability and accuracy in EXAFS structural determinations

Journal of Applied Crystallography

Volumn 34, Issue 3, 2001, Pages 325-329

  Ghigna, Paolo ^a   Di Muri, Melissa ^a   Spinolo, Giorgio ^a  

^a UNIVERSITY OF PAVIA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

IODINE; OXYGEN; SILVER;

ACCURACY; ARTICLE; CHEMICAL STRUCTURE; COMPUTER SIMULATION; INFORMATION PROCESSING; NOISE; STRUCTURE ANALYSIS; X RAY ANALYSIS;

EID: 0034993078     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889801004745     Document Type: Article

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