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Volumn 61, Issue 10, 2000, Pages 6596-6610

Error analysis of XAFS measurements

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[No Author keywords available]

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EID: 0001702290     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.61.6596     Document Type: Article
Times cited : (24)

References (17)
  • 2
    • 0003673335 scopus 로고    scopus 로고
    • E. A. Stern, in X-Ray Absorption, edited by D. C. Koningsberger and R. Prins (Wiley, New York, 1988), p. 3.
    • X-Ray Absorption , pp. 3
    • Stern, E.1
  • 8
    • 0003673335 scopus 로고    scopus 로고
    • D. E. Sayers and B. A. Bunker, in X-Ray Absorption, edited by D. C. Koningsberger and R. Prins (Wiley, New York, 1988), p. 211.
    • X-Ray Absorption , pp. 211
    • Sayers, D.1    Bunker, B.2
  • 17
    • 0013694678 scopus 로고
    • A. L. Ankoudinov, Ph.D. thesis, University of Washington, 1996
    • S. I. Zabinsky, J. J. Rehr, A. Ankudinov, R. Albers, and M. J. Eller, Phys. Rev. B 52, 2995 (1995);A. L. Ankoudinov, Ph.D. thesis, University of Washington, 1996.
    • (1995) Phys. Rev. B , vol.52 , pp. 2995
    • Zabinsky, S.1    Rehr, J.2    Ankudinov, A.3    Albers, R.4    Eller, M.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.