Application of time-of-flight secondary ion mass spectrometry to automobile paint analysis

Analytical Sciences

Volumn 17, Issue 6, 2001, Pages 757-761

  Lee, Yeonhee ^a   Han, Seunghee ^a   Yoon, Jung Hyeon ^a   Kim, Young Man ^a   Shon, Sung Kun ^b   Park, Sung Woo ^b  

^a Korea Institute of Science and Technology   (South Korea)

^b National Institute of Scientific Investigation   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMOBILE MANUFACTURE; ORGANIC POLYMERS; PAINT; SECONDARY EMISSION;

AUTOMOBILE PAINTS; AUTOMOTIVE PAINTS; ELEMENTAL COMPOSITIONS; HIGH RESOLUTION; NON DESTRUCTIVE; RELATIVE ABUNDANCE; SURFACE LAYERS; TIME OF FLIGHT SECONDARY ION MASS SPECTROMETRY;

SECONDARY ION MASS SPECTROMETRY;

PAINT;

ACCURACY; ANALYTIC METHOD; ARTICLE; CHEMICAL ANALYSIS; CHEMICAL COMPOSITION; COLOR; MASS SPECTROMETRY;

EID: 0034974370     PISSN: 09106340     EISSN: None     Source Type: Journal    
DOI: 10.2116/analsci.17.757     Document Type: Article

References (15)