Phase determination and extension using X-ray multiple diffraction and the maximum-entropy method

Acta Crystallographica Section A: Foundations of Crystallography

Volumn 57, Issue 4, 2001, Pages 420-428

  Wang, Chien Mei ^a   Chao, Chun Hsiung ^a,b   Chang, Shih Lin ^a,b  

^a NATIONAL TSING HUA UNIVERSITY   (Taiwan)

^b NATIONAL SYNCHROTRON RADIATION RESEARCH CENTER   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

ARTICLE; CRYSTAL STRUCTURE; CRYSTALLOGRAPHY; ELECTRON; ENTROPY; X RAY DIFFRACTION;

EID: 0034943963     PISSN: 01087673     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0108767300018869     Document Type: Article

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