Advances in full-face, full-complex SLM characterization

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4387, Issue , 2001, Pages 68-77

  Monroe, Stanley E ^a   Rollins, J Michael ^b,d   Juday, Richard D ^c,e  

^a LOCKHEED MARTIN   (United States)

^b Hernandez Engineering   (United States)

^c NASA HEADQUARTERS   (United States)

^d Hernandez Engineering Inc   (United States)

^e NASA JOHNSON SPACE CENTER   (United States)

Author keywords

Optical correlation; Spatial light modulators

Indexed keywords

AMPLITUDE MODULATION; INTERFEROMETRY; OPTICAL CORRELATION; OPTICAL FILTERS; PHASE MODULATION;

MULTI-STEP INTERFEROMETRY; SPATIAL LIGHT MODULATORS (SLM);

LIGHT MODULATORS;

EID: 0034935561     PISSN: 0277786X     EISSN: None     Source Type: Journal    
DOI: 10.1117/12.421153     Document Type: Article

References (4)

1. Full face, full complex characterization of a reflective SLM
2. Accelerated phase-measuring algorithm of least squares for phase-shifting interferometry