Virtual spatially modulated illumination microscopy predicts nanometer precision of axial distance measurement

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4260, Issue , 2001, Pages 120-125

  Failla, A V ^a   Cremer, C ^a  

^a UNIVERSITY OF HEIDELBERG   (Germany)

Author keywords

Computer simulations; Spatially Modulated Illumination (SMI) microscopy; Virtual microscopy

Indexed keywords

CELLS; COMPUTER SIMULATION; IMAGE ANALYSIS; OPTICAL RESOLVING POWER;

SPECTRAL PRECISION DISTANCE MICROSCOPY (SPDM);

OPTICAL MICROSCOPY;

EID: 0034935416     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.426779     Document Type: Conference Paper

References (17)

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