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Volumn 4415, Issue , 2001, Pages 98-103

Structure investigationn of luminescent porous GaAs layers

Author keywords

AFM; Photoluminescence; Porous GaAs; XPS

Indexed keywords

ATOMIC FORCE MICROSCOPY; CURRENT DENSITY; ETCHING; PHOTOLUMINESCENCE; POROUS MATERIALS; SCANNING ELECTRON MICROSCOPY;

EID: 0034934036     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.425477     Document Type: Conference Paper
Times cited : (1)

References (4)
  • 4
    • 0004581053 scopus 로고    scopus 로고
    • Russian source


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.