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Volumn 4415, Issue , 2001, Pages 98-103
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Structure investigationn of luminescent porous GaAs layers
a a a a a a a |
Author keywords
AFM; Photoluminescence; Porous GaAs; XPS
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
CURRENT DENSITY;
ETCHING;
PHOTOLUMINESCENCE;
POROUS MATERIALS;
SCANNING ELECTRON MICROSCOPY;
ELECTROCHEMICAL ETCHING;
SEMICONDUCTING GALLIUM ARSENIDE;
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EID: 0034934036
PISSN: 0277786X
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1117/12.425477 Document Type: Conference Paper |
Times cited : (1)
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References (4)
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