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Journal of the American Society for Mass Spectrometry

Volumn 10, Issue 10, 1999, Pages 1016-1027

Quantitative secondary ion mass spectrometry depth profiling of surface layers of cubic silver halide microcrystals

(3) Verlinden, G a Gijbels, R a Geuens, I a

a UNIVERSITY OF ANTWERP (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

HALIDE; SILVER; SILVER HALIDE; UNCLASSIFIED DRUG;

CRYSTAL; HALIDE; MASS SPECTROMETRY; SILVER; SURFACE PROPERTY;

ARTICLE; CALIBRATION; CRYSTAL; DISPERSION; MASS SPECTROMETRY; PRECIPITATION; SCANNING ELECTRON MICROSCOPY; SURFACE PROPERTY; VELOCITY;

EID: 0033472942 PISSN: 10440305 EISSN: None Source Type: Journal
DOI: 10.1016/S1044-0305(99)00064-1 Document Type: Article

Times cited : (5)

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