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Volumn 64, Issue 3, 2001, Pages 0353041-0353048
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Scanning tunneling microscopy and ab initio calculations: c(4 × 8) reconstructions of Pb on Si and Ge(001)
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Author keywords
[No Author keywords available]
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Indexed keywords
GERMANIUM;
LEAD;
SILICON;
ARTICLE;
CALCULATION;
ENERGY;
MATERIALS;
MATERIALS TESTING;
SCANNING TUNNELING MICROSCOPY;
STRUCTURE ANALYSIS;
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EID: 0034906634
PISSN: 01631829
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (8)
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References (29)
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