SCOPUS 정보 검색 플랫폼

Volumn 88, Issue 4, 2001, Pages 265-274

X-ray spectral simulation and experimental detection of phosphorus segregation to grain boundaries in the presence of molybdenum

(3) Papworth, Adam J a Watanabe, Masashi b Williams, David B a

a Lehigh University (United States)

b KYUSHU UNIVERSITY (Japan)

Author keywords

Grain boundary segregation; Minimum detection level; Spectral simulation

Indexed keywords

COMPUTER SIMULATION; ENERGY DISPERSIVE SPECTROSCOPY; GRAIN BOUNDARIES; MOLYBDENUM; SCANNING ELECTRON MICROSCOPY; SPECTRUM ANALYZERS; TRANSMISSION ELECTRON MICROSCOPY;

PHOSPHORUS SEGREGATION;

PHOSPHORUS;

ALLOY; MOLYBDENUM; PHOSPHORUS; STEEL;

ARTICLE; BOUNDARY LAYER; CONTROLLED STUDY; ELECTRON MICROSCOPE; ENERGY; GRAIN; QUANTITATIVE ASSAY; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SIMULATION; THICKNESS; X RAY SPECTROMETRY;

ELECTRON PROBE MICROANALYSIS; MOLYBDENUM; PHOSPHORUS;

EID: 0034898430 PISSN: 03043991 EISSN: None Source Type: Journal
DOI: 10.1016/S0304-3991(01)00083-3 Document Type: Article

Times cited : (5)

References (15)

1
- 0004440794
- Scanning Electron Microscopy and X-ray Microanalysis, 2nd edition, New York: Plenum Press
- (1992) , pp. 377
- Goldstein, J.I.¹ Newbury, D.E.² Echlin, P.³ Joy, D.C.⁴ Romig A.D., Jr.⁵ Lyman, C.E.⁶ Fiori, C.E.⁷ Lifshin, E.⁸

2
- 0004386056
- Armstrong J.T. (Ed.), Microbeam Analysis, San Francisco, CA: San Francisco Press
- (1985) , pp. 357
- Klein, C.F.¹ Ayer, R.² Williams, D.B.³

3
- 0004386587
- NIST/NIH Desk-Top Spectrum Analyzer; available from the National Institute of Standards and Technology, Gaithersburg, MD 20899, USA ( http://micro.nist.gov/DTSA/dtsa.html).

4
- 0032967702
- (1999) Ultramicroscopy , vol.78 , pp. 89
- Watanabe, M.¹ Williams, D.B.²

5
- 0033687524
- (2000) Scr. Mater. , vol.42 , pp. 1107
- Papworth, A.J.¹ Williams, D.B.²

6
- 51249183289
- (1983) Metall. Trans. , vol.14 A , pp. 1101
- Qu, Z.¹ McMahon C.J., Jr.²

7
- 0022060609
- (1985) Metall. Trans. , vol.16 A , pp. 721
- Bandyopadhyay, N.¹ Briant, C.L.² Hall, E.L.³

8
- 0033922353
- (2000) J. Microsc. , vol.199 , pp. 37
- Wollman, D.A.¹ Nam, S.W.² Hilton, G.C.³ Irwin, K.D.⁴ Dulcie, L.L.⁵ Martinis, D.A.J.M.⁶ Newbury, D.E.⁷

9
- 0004440606
- (1987) J. Phys. Colloq. C , vol.9 , pp. 487
- Jakoby, C.¹ Genz, H.² Richter, A.³

10
- 0001564477
- (1930) Ann. Phys. , vol.5 , pp. 325
- Bethe, H.¹

11
- 0004415491
- Newbury D.E. (Ed.), Microbeam Analysis, San Francisco, CA: San Francisco Press
- (1979) , pp. 124
- Romig A.D., Jr.¹ Goldstein, J.I.²

12
- 0016717822
- (1975) J. Microsc. , vol.103 , pp. 203
- Cliff, G.¹ Lorimer, G.W.²

13
- 0022699177
- (1986) Scr. Metall. , vol.20 , pp. 587
- Möller, R.¹ Brenner, S.S.² Grabke, H.J.³

14
- 0024717687
- (1989) Acta Metall. , vol.37 , pp. 2287
- Menyhard, M.¹ McMahon, C.J.²

15
- 0026908112
- (1992) Metall. Trans. , vol.23 A , pp. 2243
- Thauvin, G.¹ Lorang, G.² Leymonie, C.³

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