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Volumn 88, Issue 4, 2001, Pages 219-229

Glassy cholesteric structure: Thickness variation induced by electron radiation in transmission electron microscopy investigated by atomic force microscopy

Author keywords

Atomic force microscopy; Electron channelling; Radiation effects; Transmission electron microscopy

Indexed keywords

ATOMIC FORCE MICROSCOPY; DENSITY (SPECIFIC GRAVITY); ELECTRON IRRADIATION; ELECTRONS; ETCHING; MICROSTRUCTURE; MOLECULAR ORIENTATION; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0034898386     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(01)00087-0     Document Type: Article
Times cited : (34)

References (32)
  • 5
    • 0002019070 scopus 로고
    • Siegel B.M., Beaman D.R. (Eds.), Electron Microscopy and Microbeam Analysis, New York: Wiley
    • (1975) , pp. 231
    • Reimer, L.1
  • 7
    • 0001406267 scopus 로고
    • Siegel B.M., Beaman D.R. (Eds.), Electron Microscopy and Microbeam Analysis, New York: Wiley
    • (1975) , pp. 205
    • Glaeser, R.M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.