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Volumn 88, Issue 4, 2001, Pages 219-229
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Glassy cholesteric structure: Thickness variation induced by electron radiation in transmission electron microscopy investigated by atomic force microscopy
a
CEMES CNRS
(France)
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Author keywords
Atomic force microscopy; Electron channelling; Radiation effects; Transmission electron microscopy
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
DENSITY (SPECIFIC GRAVITY);
ELECTRON IRRADIATION;
ELECTRONS;
ETCHING;
MICROSTRUCTURE;
MOLECULAR ORIENTATION;
TRANSMISSION ELECTRON MICROSCOPY;
ULTRAMICROTOMY;
CHOLESTERIC LIQUID CRYSTALS;
CHOLESTEROL;
GLASS;
ATOMIC FORCE MICROSCOPY;
CONTRAST;
CONTROLLED STUDY;
DENSITY;
ELECTRON RADIATION;
LIQUID CRYSTAL;
MASS;
REVIEW;
STRUCTURE ANALYSIS;
SURFACE PROPERTY;
THICKNESS;
TRANSMISSION ELECTRON MICROSCOPY;
VARIANCE;
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EID: 0034898386
PISSN: 03043991
EISSN: None
Source Type: Journal
DOI: 10.1016/S0304-3991(01)00087-0 Document Type: Article |
Times cited : (34)
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References (32)
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