SCOPUS 정보 검색 플랫폼

Ultramicroscopy

Volumn 80, Issue 4, 1999, Pages 247-254

Dose-rate dependence of electron-induced mass loss from organic specimens

(2) Egerton, R F a,b Rauf, I a,c

a UNIVERSITY OF ALBERTA (Canada)

b PORTLAND STATE UNIVERSITY (United States)

c NONE (United States)

Author keywords

Electron energy loss spectroscopy (EELS); Radiation effects (experimental)

Indexed keywords

APPROXIMATION THEORY; COMPUTER SIMULATION; COMPUTER SOFTWARE; CURRENT DENSITY; DIFFUSION; ELECTRON BEAMS; ELECTRON ENERGY LOSS SPECTROSCOPY; LOW TEMPERATURE EFFECTS; MATHEMATICAL MODELS; SCANNING ELECTRON MICROSCOPY; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY;

SCANNING TUNNELING ELECTRON MICROSCOPY; ULTRAMICROSCOPY;

COLLOIDS;

ARTICLE; COMPUTER MODEL; ELECTRON BEAM; ELECTRON ENERGY LOSS SPECTROSCOPY; FILM; LOW TEMPERATURE; RADIATION RESPONSE; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0032754786 PISSN: 03043991 EISSN: None Source Type: Journal
DOI: 10.1016/S0304-3991(99)00114-X Document Type: Article

Times cited : (38)

References (26)

1
- 0001406267
- B.M. Siegel, D.R. Beaman (Eds.), Wiley, New York
- R.M. Glaeser, in: B.M. Siegel, D.R. Beaman (Eds.), Physical Aspects of Electron Microscopy and Microbeam Analysis, Wiley, New York, 1975, p. 205.
- (1975) Physical Aspects of Electron Microscopy and Microbeam Analysis , pp. 205
- Glaeser, R.M.¹

2
- 0018190240
- V.E. Cosslett, J. Microscopy 113 (1978) 113.
- (1978) J. Microscopy , vol.113 , pp. 113
- Cosslett, V.E.¹

3
- 84913724554
- Developments in Electron Microscopy and Analysis 1981
- M.J. Goringe (Ed.), Institute of Physics, Bristol
- E. Zeitler, in: M.J. Goringe (Ed.), Developments in Electron Microscopy and Analysis 1981, IOP Conference Series No. 61, Institute of Physics, Bristol, 1982, p. 1.
- (1982) IOP Conference Series , vol.61 , pp. 1
- Zeitler, E.¹

4
- 0002251039
- M.S. Isaacson, Principles Tech. Electron Microsc. 7 (1977) 1.
- (1977) Principles Tech. Electron Microsc. , vol.7 , pp. 1
- Isaacson, M.S.¹

5
- 0002019070
- B.M. Siegel, D.R. Beaman (Eds.), Wiley, New York
- L. Reimer, in: B.M. Siegel, D.R. Beaman (Eds.), Physical Aspects of Electron Microscopy and Microbeam Analysis, Wiley, New York, 1975, p. 231.
- (1975) Physical Aspects of Electron Microscopy and Microbeam Analysis , pp. 231
- Reimer, L.¹

6
- 0015251679
- D.E. Johnson, Radiat. Res. 49 (1972) 63-84.
- (1972) Radiat. Res. , vol.49 , pp. 63-84
- Johnson, D.E.¹

7
- 0016116491
- D.T. Grubb, J. Mater. Sci. 9 (1974) 1715.
- (1974) J. Mater. Sci. , vol.9 , pp. 1715
- Grubb, D.T.¹

8
- 84981389782
- R.F. Egerton, J. Microsc. 118 (1980) 389.
- (1980) J. Microsc. , vol.118 , pp. 389
- Egerton, R.F.¹

9
- 0006285024
- R.S. Payne, G. Beamson, Polymer 34 (1993) 1637.
- (1993) Polymer , vol.34 , pp. 1637
- Payne, R.S.¹ Beamson, G.²

10
- 0345064507
- D.L. Dorset, J.N. Turner, Naturwissenschaften 63 (1976) 145.
- (1976) Naturwissenschaften , vol.63 , pp. 145
- Dorset, D.L.¹ Turner, J.N.²

11
- 0019266198
- R.F. Egerton, Ultramicroscopy 5 (1980) 521.
- (1980) Ultramicroscopy , vol.5 , pp. 521
- Egerton, R.F.¹

12
- 0026025632
- M.K. Lamvik, J. Microscopy 161 (1991) 171.
- (1991) J. Microscopy , vol.161 , pp. 171
- Lamvik, M.K.¹

13
- 0022578580
- International Experimental Study Group, J. Microsc. 141 (1986) 385.
- (1986) J. Microsc. , vol.141 , pp. 385

14
- 0016783316
- S.M. Salih, V.E. Cosslett, J. Microsc. 105 (1985) 269.
- (1985) J. Microsc. , vol.105 , pp. 269
- Salih, S.M.¹ Cosslett, V.E.²

15
- 0345064506
- G. Siegle, Naturfroschung 27a (1972) 325.
- (1972) Naturfroschung , vol.27 A , pp. 325
- Siegle, G.¹

16
- 0003394101
- plenum, New York
- R.F. Egerton, in: Electron Energy-Loss Spectroscopy in the Electron Microscope, 2nd Edition, plenum, New York, 1996.
- (1996) Electron Energy-Loss Spectroscopy in the Electron Microscope, 2nd Edition
- Egerton, R.F.¹

17
- 0344202250
- Y. Talmon, E. L Thomas, Scanning Electron Microsc. 1 (1977) 165.
- (1977) Scanning Electron Microsc. , vol.1 , pp. 165
- Talmon, Y.¹ Thomas, E.L.²

18
- 0003542713
- Academic Press, London
- J. Crank, G.S. Park, in: Diffusion in Polymers, Academic Press, London, 1968, pp. 46-50.
- (1968) Diffusion in Polymers , pp. 46-50
- Crank, J.¹ Park, G.S.²

19
- 0003884869
- CRC Press, Boca Raton
- J.F. Shackelford, W. Alexander, J.S. Park (Eds.), CRC Materials Science and Engineering Handbook, CRC Press, Boca Raton, 1994, p. 296.
- (1994) CRC Materials Science and Engineering Handbook , pp. 296
- Shackelford, J.F.¹ Alexander, W.² Park, J.S.³

20
- 0019487995
- H. Kohl, H. Rose, H. Schnabl, Optik 58 (1981) 11.
- (1981) Optik , vol.58 , pp. 11
- Kohl, H.¹ Rose, H.² Schnabl, H.³

21
- 0027156037
- S. Williams, X. Zhang, C. Jacobsen, J. Kirz, S. Lindaas, J. van't Hof, S.S. Lam, J. Microsc. 170 (1993) 155.
- (1993) J. Microsc. , vol.170 , pp. 155
- Williams, S.¹ Zhang, X.² Jacobsen, C.³ Kirz, J.⁴ Lindaas, S.⁵ Van't Hof, J.⁶ Lam, S.S.⁷

22
- 0022929708
- K.H. Downing, R.M. Glaeser, Ultramicroscopy 20 (1986) 269.
- (1986) Ultramicroscopy , vol.20 , pp. 269
- Downing, K.H.¹ Glaeser, R.M.²

23
- 0023534313
- J.R. Fryer, Ultramicroscopy 23 (1987) 321.
- (1987) Ultramicroscopy , vol.23 , pp. 321
- Fryer, J.R.¹

24
- 0346390029
- J.R. Fryer, F.M. Holland, Proc. Roy. Soc. (Lond.) A 393 (1984) 352.
- (1984) Proc. Roy. Soc. (Lond.) A , vol.393 , pp. 352
- Fryer, J.R.¹ Holland, F.M.²

25
- 0031570695
- K. Varlot, J.M. Martin, C. Quet, Y. Kihn, Ultramicroscopy 68 (1997) 123.
- (1997) Ultramicroscopy , vol.68 , pp. 123
- Varlot, K.¹ Martin, J.M.² Quet, C.³ Kihn, Y.⁴

26
- 22444455745
- K. Siangchaew, M. Libera, Microsc. Microanal. 4 (Suppl 2) (1998) 804.
- (1998) Microsc. Microanal. , vol.4 , Issue.2 SUPPL. , pp. 804
- Siangchaew, K.¹ Libera, M.²

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