Oxidation mechanism of LaTiO3.5 thin films

Physical Review B - Condensed Matter and Materials Physics

Volumn 63, Issue 20, 2001, Pages

  Seo, J W ^a,b   Fompeyrine, J ^b   Siegwart, H ^b   Locquet, J P ^b  

^a UNIVERSITY OF NEUCHÂTEL   (Switzerland)

^b IBM RESEARCH ZURICH   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

LANTHANUM; METAL OXIDE; TITANIUM DIOXIDE;

ARTICLE; ELECTRON DIFFRACTION; ENERGY; FILM; MODEL; OXIDATION; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

EID: 0034894718     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.63.205401     Document Type: Article

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