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Volumn 21, Issue 10-11, 2001, Pages 1597-1600

Morphology and electrical properties of SrTiO3-films on conductive oxide films

Author keywords

Capacitors; Chemical solution deposition; Electrical properties; Electron microscopy; Perovskites

Indexed keywords

ELECTRIC CURRENTS; MORPHOLOGY; OXIDES; SCANNING ELECTRON MICROSCOPY; SILICON WAFERS;

EID: 0034883851     PISSN: 09552219     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0955-2219(01)00073-5     Document Type: Article
Times cited : (16)

References (18)
  • 10
    • 36849116257 scopus 로고
    • X-ray diffractometry of low-temperature phase transformation in strontium titanate
    • (1964) J. Appl. Phys , vol.35 , pp. 2212-2215
    • Lytle, F.W.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.