Determination of the normalized Jones matrix of elliptical retarder

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4317, Issue , 2001, Pages 129-134

  Berezhna, Svitlana ^a   Berezhnyy, Ihor ^b   Takashi, Masahisa ^b  

^a EMORY UNIVERSITY   (United States)

^b AOYAMA GAKUIN UNIVERSITY   (Japan)

Author keywords

3D photoelasticity; Nondestructive testing; Polarimetry

Indexed keywords

BIREFRINGENCE; IMAGE PROCESSING; NONDESTRUCTIVE EXAMINATION; PHOTOELASTICITY; POLARIZATION;

FOURIER POLARIMETRY METHODS;

POLARIMETERS;

EID: 0034878655     PISSN: 0277786X     EISSN: None     Source Type: Journal    
DOI: 10.1117/12.429559     Document Type: Article

References (8)

1. Integrated photoelasticity through imaging Fourier polarimetry of an elliptic retarder
2. Dynamic photometric imaging PSA-polarimeter: Instrument for mapping birefringence and optical rotation
3. Generalized rotating-compensator ellipsometry
4. Two-dimensional birefringence measurement using the phase shifting technique
5. A simple Fourier photopolarimeter with rotating polarizer and analyzer for measuring Jones and Mueller matrices
6. A photometric ellipsometer for measuring flux in a general state of polarization